Materials Research Laboratories, Inc.

Currently, our in-house capabilities include X-ray Photoelectron Spectroscopy (XPS/ESCA), Ion Scattering Spectroscopy (ISS), High-resolution Scanning Auger Microscopy (SAM), Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), Selected Area Electron Diffraction (SAED), Energy Dispersive X-ray Spectroscopy (EDS), Infrared Spectroscopy/microscopy (FTIR/microFTIR), Laser Raman Spectroscopy/microscopy (LRS/microLRS), Ultraviolet/visible/near Infrared Spectroscopy (UV/VIS/NIR), Residual Gas Analysis (RGA), Metallography, Light Microscopy (LM), Gas/liquid Chromatography (GC), Ion Chromatography (IC), Physical Testing (tensile/shear/etc.) and X-ray Diffraction (XRD) Other available techniques include Wavelength Dispersive X-ray Spectroscopy (WDS), Scanning Transmission Electron Microscopy (STEM), Atomic Force Microscopy (AFM), Scanning Tunneling Microscopy (STM), Emission Spectroscopy (DCP/ICP), X-ray Fluorescence (XRF), Atomic Absorption Spectroscopy (AA), Gas/liquid Chromatography/mass spectroscopy (GC/LC/MS), Thermal Analysis (DSC/DTA/TGA), Nuclear Magnetic Resonance (NMR), Secondary Ion and Laser Ionization Mass Spectroscopies (SIMS/LIMS)and Time-Of-Flight Secondary Ion Mass Spectroscopy (ToFSIMS). All out-of-house analytical services are conducted by or under the direction of MRL staff at facilities with whom arrangements have been made to share and exchange analytical capabilities.